Quality Assurance and Validation for Big Data Applications

With the increase of big data applications in diverse application fields, big data computing and application service is becoming a very hot topic among academic researchers, industry practitioners, and government agencies. As more big data and application systems are gradually used in different application domains (such as business, healthcare, transportation, environment monitor and assessment, and smart city development), big data quality and quality assurance of big data application service systems become very important and critical. Based on recent reports, it has been estimated that erroneous data costs US businesses 600 billion dollars annually. This workshop will focus on the subject of quality assurance issues and challenges for big data and application service systems. There are emergent needs for research problems and directions on this subject in terms of quality control models, automation validation methods, approaches, and service platforms as well as TaaS (Testing-as-a-service) and other novel test automation techniques. We invite original papers from both academia and industry

Topics of Interest:
WORKSHOP IMPORTANT DATES
Workshop proposals submission: January 25, 2017
Author notification: February 6, 2017
Full version submission Febraury 15, 2017
Registration Deadline Febraury 28, 2017
Workshop date April 6, 2017


Deadlines
January 25, 2017 - Submission
February 6, 2017 - Notification
February 15, 2017 - Final version deadline
Feb. 28, 2017 - Registration

Submission Information
Papers must be written in English. An electronic version (Postscript, PDF, or MS Word format) of the full paper should be submitted using the following URL: https://easychair.org/conferences/?conf=ieeebigdataserviceworkshop2017

Manuscript must include a 200-word abstract and no more than 6 pages of 2-column formatted Manuscript for Conference Proceedings (include figures and references but exclude copyright form). Authors must follow IEEE Proceedings Author Guidelines to prepare papers with the template All papers must be prepared in the IEEE double column proceedings format. Please see http://www.ieee.org/conferences_events/conferences/publishing/templates.html . Each paper will be reviewed by at least three TPC members. . At least one of the authors of each accepted paper is required to pay full registration fee and present the paper at the workshop in person.

We respect the works inspired by practical studies with real world interactions because this workshop provide an exchange platform for researchers and practitioners to discuss real issues, lessons, and innovative ideas and on-going research work relating data quality and applications.

The accepted papers will be published as the part of IEEE BigDataService 2017 Proceedings by IEEE CPS and included inside IEEE Xplore digital library. The workshop program will be included as a part of IEEE BigDataService 2017 program. The selected papers with extensions will be recommended for publication in SCI Index and EI Index Journals.

Paper Review and Publication
All submitted papers will be reviewed by the PC members. Each paper will be reviewed at least by three reviewers. All accepted papers will be included in the symposium proceedings of IEEE BigdataService 2017. At least one author of each accepted paper must attend the workshop to present the work. Selected best papers (extended versions) will be published in journals
Journal Special Issue:

The best experience papers will be recommended to The following Journals:

Journal Special Issue Proposal on Quality Assurance and Management for Big Data



To submit your paper to the Special Issue journal, click on the submission link.

Software: Practice and Experience

John Wiley & Sons Ltd



Edited By: Rajkumar Buyya, R. Nigel Horspool
ISI Journal Citation Reports
Ranking: 2014: 57/104 (Computer Science Software Engineering)
ISSN: 1097-024X (electronic version)

International Journal of Data Science and Analytics



Editor-in-Chief: Longbing Cao
ISSN: 2364-415X (print version)
ISSN: 2364-4168 (electronic version)
Journal no. 41060

Organizing Committee

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